Fast Ray Simulation Method Applied in Microwave Radiation Brightness Temperature Imaging

Large-scale simulation and high quality of microwave brightness temperature imaging is the key technology for passive target detection. We applied the space meshing ray tracing method for brightness temperature tracing to establish a model of tracing and inversion. Simulated images were then compared with the measured images to verify the effectiveness of the proposed method. Results showed that the space meshing ray tracing method can significantly improve the calculation efficiency, thereby allowing high-accuracy large-scale simulation using the same calculation. The effect of the low-pass filter on the simulated image was also considered.